- Fastest in its class: Twice as fast as typical testing, high precision with high speed
- Excels in scope and accuracy: Optimized application packages
- Unparalleled ease-of-use: Just three simple steps to accurate results
The new SPECTROCUBE ED-XRF analyzer for precious metals testing delivers easy, reliable, accurate, high-throughput analysis for testing centers, hallmarking and assay offices, and jewelry makers — at twice the speed of other analyzers in its class.
The SPECTROCUBE analyzer incorporates state-of-the-art nondestructive ED-XRF detector technology, including high-resolution and high-count rate, to deliver short measurement intervals, effortless workflow via intuitive software, and low downtime.
SPECTROCUBE enables a fast, smooth workflow even for minimally trained users for an unparalleled ease of use. The sample analysis is performed in three quick and easy steps, with the intuitive software presenting the relevant information on a single screen. Its compact footprint fits tight benchtop spaces yet accommodates a wide range of tiny to large samples. For most analyses, SPECTROCUBE delivers the required accuracy with only one general-purpose calibration.
Featuring exceptional speed and performance, SPECTROCUBE provides high precision for a wide range of concentration levels — plus testing times as low as 15 seconds that enable a throughput of up to hundreds of samples per working day. On jewelry samples large or small, the instrument can analyze an area down to a spot size of 0.2 mm that’s among the industry’s smallest spot sizes.
Unlike many other XRF analyzers, SPECTROCUBE features the latest in high-resolution silicon drift detector (SDD) technology and an ultra-high count rate to register minor and trace amounts of some nonprecious components. Moreover, if required, SPECTROCUBE can deliver up to three-times higher intensities at the same measurement time as previous-generation models.